Pv system with boost converter & its faults: a review Essay

PV system with boost converter & its Faults: A REVIEW

Pratik Rajendra Jadhav#1, Dr. S.B. Chavan*2

Electronics Technology, Department of Technology, Shivaji University, Kolhapur, Maharashtra, India

[email protected]

2.co.in

Abstract— In today’s scenario, there is large involvement of transformations. The solar energy is becoming a potential solution towards sustainable energy supply in future. As more and more Solar Photovoltaic systems are getting integrated into the existing grid, there is a growing need for monitoring of real time generation data obtained from solar photovoltaic plants so as to optimize the overall performance of the solar power plant. As local monitoring is not possible for the installer, therefore monitoring remotely is essential for every solar power plant.

Keywords— PV system, IGBT, MOSFET

I. Introduction

With advancing of technology in various fields like consumer, industrial, medical etc. There is a need of electric energy. This electric energy can be obtained through photovoltaic solar panels. Now days every system is interconnected via internet or interconnected node based wireless sensing devices. The new concept is spreading widely that is IoT Internet of Things. Recently, it is use for the field of consumer electronics and appliances but also in other various fields such as a smart city, healthcare, smart home, smart car, energy system, and industrial security. At present, the solar photovoltaic (PV) energy is one of the pivotal renewable energy sources. Power generation from Solar Photovoltaic plants is variable in nature due to changes in solar irradiance, temperature and other factors. Therefor remote monitoring is essential. For developing remote monitoring system and fault detection in solar photovoltaic power plant.

II. LITERATURE SURVEY

Young-Joo Lee, and Ali Emadi [1] this paper proposes boost converter with two phase shift switches, which has same characteristics as conventional but it has twice current ripple frequency. In the boost converter there are two phase shifting switches used, which are in parallel. This boost converter act same as conventional single switch converter, actual system bandwidth and the inductors frequency increases which will give freeness to select switching devices like IGBT or MOSFETS.

Z. Khatir , S. Lefebvre[2] deals with observed failure modes, due to thermal fatigue, are the solder cracks between the copper base plate and the direct copper bonding (DCB) substrate and bond wire lift-off. IGBT modules are used, nowadays, as basic switches for medium and high power inverters for traction applications. Here in this reference presents an analysis method based on the boundary element method (BEM) to investigate thermal behaviour of high power semiconductor packages subjected to power cycling loads.

Joseph B. Bernstein [3] deals with the intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs, physical behaviour of the critical failure mechanisms in microelectronic devices are significantly grown. Here in this reference prediction methods and presents an approach for accurate system reliability modelling in the competing mechanisms described which helps to predict system reliability and failure rate.

Kuei-Hsiang Chao, Sheng-Han Hob [4] this paper deals with the major faults occurred in the PV systems as they are unpredictable so continuous monitoring should be done. The PSIM circuit based model is for shadowing fault and the malfunctioning of the system to measure overall system performance and it also useful for I-V and P-V characteristics as the PV panels surface temperature vary due to irradiation of the sunlight. The electrical anomaly and solar cell aging also cause the system performance down. This PSIM simulation software will help for power electronics application such as PV system fault detection.

Y.-J. Lee and A. Emadi [5] this paper deal with the different types of converter which currently useful in the PV systems so that there are mainly discussed boost converter and buck-boost converter. In order to make such converters fault current tolerance done in such a way the current way include switches passes inductor will help to reduce sharp fault current. In the converters while charging time there will be conduction loss occurs that is in diode, IGBT or MOSFET, input power.

M.Davrifar, A.Rabhi",A El-Hajjaji [6] this paper deal with the fault occurred in the PV systems and using statistical signal processing and MATLAB simulation. In this paper there are methods which are visual, thermal and electrical analysis based. The maximum power point tracking algorithm is there for to track the maximum power which is developed in the PV panel. In electrical fault occur due to miss soldering of electronic component, shirt circuit in bus, component failure. They are hardware related it should be avoided by proper unit testing while making circuit.

Wojciech Sleszynski, Janusz Nieznanski [7] this paper deal with fault occur in the open transistor for isolation of open transistor fault and the voltage – source inverter feed backing method. About transistor faults are observed highly as a signal based. The output of the transistor can be helpful for monitoring or diagnosis purpose. The diagnosis method may be based on the variation or elevation of dc component, by putting threshold values so electronic component malfunctioning can be determined. The fourier transform can be used for to find the actual and commanded current space vector in the reference band method.

Kai Rothenhagen, Friedrich Wilhelm Fuchs[8] this paper deals with the faults caused in electronic components, in this paper the artificial intelligence also used for the fault detection purpose, and also the physical damage of the electronic component will also lead the system performance degradation. This paper gives information of the fault isolation scheme, A performance laboratory set up done via MATLAB simulation software, the main focus is on faulty sensor and its componenets.

III. Conclusions

After review from the above-mentioned sources, it seems that many PV systems deployed at various regions have their own need for fault supervision and diagnosis. Such faults might be caused due to environmental that is short circuit cause due to rain, also thermal faults due to high temperature, aging of PV Panel, electrical fault caused by component failure like diode, IGBT, load. In order to avoid such fault they must be monitored and avoided by using signal conditioning, maintaining the I-V, P-V characteristics database to predict system future abnormal behaviour. This will improve system performance as well as reliability.

References

[1] Young-Joo Lee, and Ali Emadi Phase Shift Switching Scheme for DC/DC Boost Converter with Switches in Parallel IEEE Power Electronics and Motor Drives Laboratory Electric Power and Power Electronics Center Electrical and Computer Engineering Department Illinois Institute of Technology Chicago, IL 60616-3793, USA IEEE 2008

[2] Z. Khatir , S. Lefebvre Boundary element analysis of thermal fatigue effects on high power IGBT modules Microelectronics Reliability 44 (2004) 929–938.

[3] Joseph B. Bernstein",Moshe Gurfinkel, Xiaojun Li, Jorg Walters Yoram Shapira, Michael Talmor Electronic circuit reliability modeling Microelectronics Reliability 46 (2006) 1957–1979

[4] Kuei-Hsiang Chao, Sheng-Han Hob, Meng-Hui Wang, a Modeling and fault diagnosis of a photovoltaic system, Electric Power Systems Research, Volume 78, Issue 1, January 2008, pp. 97-105.

[5] Y.J. Lee and A. Emadi, Integrated bi-directional AC/DC and DC/DC converter for plug-in hybrid electric vehicle conversion, in IEEE Vehicle Power and Propulsion Conference, pp. 215-222, June 2007.

[6] M.Davrifar, A. Rabhi",A El-Hajjaji and M.Dhamne Real-Time Model Based Fault Diagnosis Of PV Panels Using Statistical Signal Processing 20-23 October 2013

[7] Wojciech Sleszynski, Janusz Nieznanski, Artur Cichowski Open-Transistor Fault Diagnostics in Voltage-Source Inverters by Analyzing the Load Currents IEEE Transaction On Industrial Electronics, Vol. 56, No. 11, November 2009.

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